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[IEEE 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Reno, NV, USA (2015.9.27-2015.10.2)] 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - A new full-chip verification methodology to prevent CDM oxide failures
Etherton, Melanie, Ruth, Scott, Miller, James W., Agarwal, Rishabh, Bhooshan, Rishi, Ershov, Maxim, Cadjan, Meruzhan, Feinberg, Yuri, Srinivasan, Karthik, Chang, Norman, Youlin Liao,Year:
2015
Language:
english
DOI:
10.1109/eosesd.2015.7314811
File:
PDF, 1.58 MB
english, 2015