[IEEE Proceedings of the 39th Annual Hawaii International Conference on System Sciences (HICSS'06) - Kauia, HI, USA (2006.01.4-2006.01.7)] Proceedings of the 39th Annual Hawaii International Conference on System Sciences (HICSS'06) - Dealing with Risk in Incident Management: An Application of High Reliability Theory
Van Den Eede, G., Van de Walle, B., Rutkowski, A.Year:
2006
Language:
english
DOI:
10.1109/hicss.2006.112
File:
PDF, 147 KB
english, 2006