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[IEEE 2015 International Conference on Electrical Engineering and Information Communication Technology (ICEEICT) - Savar, Dhaka, Bangladesh (2015.5.21-2015.5.23)] 2015 International Conference on Electrical Engineering and Information Communication Technology (ICEEICT) - Gate length scaling of Si nanowire FET: A NEGF study
Khan, Touhid, Iztihad, Hossain Md., Sufian, Abu, Alam, Md. Nur Kutubul, Mollah, Md. Nurunnabi, Islam, Md. RafiqulYear:
2015
Language:
english
DOI:
10.1109/iceeict.2015.7307505
File:
PDF, 425 KB
english, 2015