[IEEE 2015 4th International Conference on Reliability,...

  • Main
  • [IEEE 2015 4th International Conference...

[IEEE 2015 4th International Conference on Reliability, Infocom Technologies and Optimization (ICRITO) (Trends and Future Directions) - Noida, India (2015.9.2-2015.9.4)] 2015 4th International Conference on Reliability, Infocom Technologies and Optimization (ICRITO) (Trends and Future Directions) - Effect of parasitic patch configurations on multi-banding of microstrip antenna

Kaul, Nishant, Bhat, Sohaib, Gupta, Anchal, Chaurasiya, Himanshu
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2015
Language:
english
DOI:
10.1109/icrito.2015.7359239
File:
PDF, 936 KB
english, 2015
Conversion to is in progress
Conversion to is failed