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[IEEE 2015 First International Conference on Reliability Systems Engineering (ICRSE) - Beijing, China (2015.10.21-2015.10.23)] 2015 First International Conference on Reliability Systems Engineering (ICRSE) - Estimation method for extremely small sample accelerated degradation test data
Zhang, Hailong, Yuan, Hongjie, Li, PeichangYear:
2015
Language:
english
DOI:
10.1109/icrse.2015.7366417
File:
PDF, 251 KB
english, 2015