[IEEE 2015 IEEE CPMT Symposium Japan (ICSJ) - Kyoto, Japan (2015.11.9-2015.11.11)] 2015 IEEE CPMT Symposium Japan (ICSJ) - Influence of thermo-mechanical stress on the microstructure of sintered silver joints for microelectronics
Geoffroy, Thomas, Riou, Jean-Christophe, Bailly, Eric, Tarrisse, Gilles, Bienvenu, YvesYear:
2015
Language:
english
DOI:
10.1109/icsj.2015.7357360
File:
PDF, 2.24 MB
english, 2015