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[IEEE 2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. - Istanbul, Turkey (2003.05.16-2003.05.16)] 2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. - Double bulk current injection: a new harness setup to correlate immunity test methods
Cuvelier, M., Rioult, J., Klingler, M., Ficheux, S.Year:
2003
Language:
english
DOI:
10.1109/icsmc2.2003.1428235
File:
PDF, 398 KB
english, 2003