![](/img/cover-not-exists.png)
[IEEE 2010 2nd International Conference on Signal Processing Systems (ICSPS 2010) - Dalian (2010.07.5-2010.07.7)] 2010 2nd International Conference on Signal Processing Systems - The applicaion of photoelectric inspecting technique in yarn defect test
Xu Guo-sheng,Year:
2010
Language:
english
DOI:
10.1109/icsps.2010.5555620
File:
PDF, 228 KB
english, 2010