![](/img/cover-not-exists.png)
[IEEE 2015 10th International Design & Test Symposium (IDT) - Dead Sea, Amman, Jordan (2015.12.14-2015.12.16)] 2015 10th International Design & Test Symposium (IDT) - A method of LFSR seed generation for hierarchical BIST
Sawaki, Kosuke, Ohtake, SatoshiYear:
2015
Language:
english
DOI:
10.1109/idt.2015.7396747
File:
PDF, 248 KB
english, 2015