[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - Cycling pattern and read/bake conditions dependence of random telegraph noise in decananometer NAND flash arrays
Miccoli, Carmine, Paolucci, Giovanni M., Compagnoni, Christian Monzio, Spinelli, Alessandro S., Goda, AkiraYear:
2015
Language:
english
DOI:
10.1109/irps.2015.7112812
File:
PDF, 484 KB
english, 2015