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[IEEE 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Chicago, Il, USA (8-12 Aug. 2005)] 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Neural network detection and identification of electronic devices based on their unintended emissions
Haixiao Weng,, Xiaopeng Dong,, Xiao Hu,, Beetner, D.G., Hubing, T., Wunsch, D.Volume:
1
Year:
2005
Language:
english
DOI:
10.1109/isemc.2005.1513508
File:
PDF, 233 KB
english, 2005