[IEEE 2015 IEEE International Symposium on Electromagnetic Compatibility - EMC 2015 - Dresden, Germany (2015.8.16-2015.8.22)] 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC) - Field uniformity in radiated field immunity tests
Audone, Bruno, Colombo, Roberto, Borsero, MicheleYear:
2015
Language:
english
DOI:
10.1109/isemc.2015.7256287
File:
PDF, 979 KB
english, 2015