[IEEE 1995 IEEE Nuclear Science Symposium and Medical Imaging Conference Record - San Francisco, CA, USA (21-28 Oct. 1995)] 1995 IEEE Nuclear Science Symposium and Medical Imaging Conference Record - Microscopic analysis of defects in a high resistivity silicon detector irradiated to 1.7×10/sup 15/ n/cm/sup 2/
Li, Z., Ghislotti, G., Kraner, H.W., Li, C.J., Nielsen, B., Feick, H., Lindstroem, G.Volume:
2
Year:
1995
Language:
english
DOI:
10.1109/nssmic.1995.510403
File:
PDF, 558 KB
english, 1995