[IEEE 2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings - Sinaia, Romania (10-14 Oct. 2000)] 2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings (Cat. No.00TH8486) - Building-in reliability technology for diodes manufacturing
Bazu, M., Udrea-Spenea, M., Tsoi, E., Turtudau, F., Ilian, V., Papaioannou, G., Galateanu, L., Stan, A., Tserepi, A., Bucur, M.Volume:
1
Year:
2000
Language:
english
DOI:
10.1109/smicnd.2000.890248
File:
PDF, 374 KB
english, 2000