Design-Time Reliability Enhancement Using Hotspot...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2016 / 3 Vol. 24; Iss. 3

Design-Time Reliability Enhancement Using Hotspot Identification for RF Circuits

Chang, Doohwang, Kitchen, Jennifer N., Bakkaloglu, Bertan, Kiaei, Sayfe, Ozev, Sule
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Volume:
24
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2015.2428221
Date:
March, 2016
File:
PDF, 1.25 MB
english, 2016
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