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Modelling and test generation for MOS transmission gate stuck-open faults
Belkadi, M., Mouftah, H.T.Volume:
139
Year:
1992
Language:
english
Journal:
IEE Proceedings G Circuits, Devices and Systems
DOI:
10.1049/ip-g-2.1992.0004
File:
PDF, 430 KB
english, 1992