[IEEE 2016 29th International Conference on VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID) - Kolkata, India (2016.1.4-2016.1.8)] 2016 29th International Conference on VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID) - Analyzing the Impact of SEUs on SRAMs with Resistive-Bridge Defects
Medeiros, G. Cardoso, Poehls, L. Bolzani, Vargas, Fabian F.Year:
2016
Language:
english
DOI:
10.1109/VLSID.2016.146
File:
PDF, 360 KB
english, 2016