[IEEE 2015 22nd International Workshop on Active-Matrix Flatpanel Displays and Devices (AM-FPD) - Kyoto, Japan (2015.7.1-2015.7.4)] 2015 22nd International Workshop on Active-Matrix Flatpanel Displays and Devices (AM-FPD) - Evolution of hydrogen-related defect states in amorphous In-Ga-Zn-O analyzed by photoelectron emission yield experiments

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