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[IEEE 2015 13th International Conference The Experience of Designing and Application of CAD Systems in Microelectronics (CADSM) - Lviv - Polyana, Ukraine (2015.2.24-2015.2.27)] The Experience of Designing and Application of CAD Systems in Microelectronics - Metric for analyzing big data
Hahanova, Yulia, Yemelyanov, Igor, Hahanova, Anna, Obrizan, Volodymyr, Krulevska, Daria, Skorobogatiy, MikhailYear:
2015
Language:
english
DOI:
10.1109/cadsm.2015.7230801
File:
PDF, 236 KB
english, 2015