A new method for rapid visualization of defects in leaf...

The Plant Journal 2004 Vol. 37; Iss. 1

A new method for rapid visualization of defects in leaf cuticle reveals five intrinsic patterns of surface defects in Arabidopsis

Toshihiro Tanaka, Hirokazu Tanaka, Chiyoko Machida, Masaru Watanabe, Yasunori Machida
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Volume:
37
Year:
2004
Language:
english
Pages:
8
DOI:
10.1046/j.1365-313x.2003.01946.x
File:
PDF, 240 KB
english, 2004
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