[IEEE 2006 Design, Automation and Test in Europe - Munich,...

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[IEEE 2006 Design, Automation and Test in Europe - Munich, Germany (2006.3.6-2006.3.10)] Proceedings of the Design Automation & Test in Europe Conference - Power-Aware Compilation for Embedded Processors with Dynamic Voltage Scaling and Adaptive Body Biasing Capabilities

Po-Kuan Huang,, Ghiasi, S.
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Year:
2006
Language:
english
DOI:
10.1109/date.2006.243835
File:
PDF, 55 KB
english, 2006
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