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[IEEE 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) - San Diego, CA, USA (2015.5.26-2015.5.29)] 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) - Scanning acoustic microscopy and shear wave imaging mode performances for failure detection in high-density microassembling technologies
Remili, Z., Ousten, Y., Levrier, B., Suhir, E., Bechou, L.Year:
2015
Language:
english
DOI:
10.1109/ectc.2015.7159891
File:
PDF, 1.32 MB
english, 2015