[IEEE 2015 16th International Conference on Electronic Packaging Technology (ICEPT) - Changsha, China (2015.8.11-2015.8.14)] 2015 16th International Conference on Electronic Packaging Technology (ICEPT) - De-embedding transmission line of SiO2 thin-film measurements for accurate characteristics
Chen, Wenbin, Yun, Minghui, Cai, Miao, Wang, Xiaolei, Qin, Zhen, Yang, DaoguoYear:
2015
Language:
english
DOI:
10.1109/icept.2015.7236730
File:
PDF, 1.05 MB
english, 2015