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[IEEE 2000 22nd International Conference on Microelectronics. Proceedings - Nis, Yugoslavia (14-17 May 2000)] 2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400) - Analysis of Fowler-Nordheim injection in NO nitrided gate oxide grown on n-type 4H-SiC
Hui-Feng Li,, Dimitrijev, S., Sweatman, D., Harrison, H.B.Volume:
1
Year:
1999
Language:
english
DOI:
10.1109/icmel.2000.840582
File:
PDF, 255 KB
english, 1999