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[IEEE 2000 International Symposium on Electromagnetic Compatibility (EMC 2000) - Washington, DC, USA (21-25 Aug. 2000)] IEEE International Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.00CH37016) - Calculation of the ESD-pulse parameters and associated uncertainty for ESD-gun calibration
De Ketelaere, W., Martens, L., Braem, Y., Vlietinck, Y.Volume:
1
Year:
2000
Language:
english
DOI:
10.1109/isemc.2000.875610
File:
PDF, 347 KB
english, 2000