A Technique to Reduce On-Wafer Measurement Uncertainty for...

IEEE Microwave and Wireless Components Letters 2015 / 12 Vol. 25; Iss. 12

A Technique to Reduce On-Wafer Measurement Uncertainty for CMOS Transmission Line Characterization

Assuncao, Mario, Mendonca dos Santos, P., Freire, Joao Costa
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Volume:
25
Language:
english
Journal:
IEEE Microwave and Wireless Components Letters
DOI:
10.1109/lmwc.2015.2495131
Date:
December, 2015
File:
PDF, 674 KB
english, 2015
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