Overcoming Early-Life Failure and Aging Challenges for...

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IEEE Design and Test 2013

Overcoming Early-Life Failure and Aging Challenges for Robust System Design

Li, Yanjing, Mitra, Subhasish, Gardner, Don, Kim, Young Moon, Mintarno, Evelyn
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Year:
2013
Journal:
IEEE Design & Test
DOI:
10.1109/mdt.2009.132
File:
PDF, 583 KB
2013
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