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[IEEE 2015 14th IAPR International Conference on Machine Vision Applications (MVA) - Tokyo, Japan (2015.5.18-2015.5.22)] 2015 14th IAPR International Conference on Machine Vision Applications (MVA) - Pixel-wise radiometric line scanner calibration
Louw, Francois Johannes, Iiyama, Masaaki, Funatomi, Takuya, Minoh, MichihikoYear:
2015
Language:
english
DOI:
10.1109/mva.2015.7153171
File:
PDF, 922 KB
english, 2015