[IEEE 2006 IEEE Nanotechnology Materials and Devices...

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[IEEE 2006 IEEE Nanotechnology Materials and Devices Conference - Gyeongju, South Korea (2006.10.22-2006.10.25)] 2006 IEEE Nanotechnology Materials and Devices Conference - Multilevel dual-channel NAND flash memories with high-speed read and verifying program

Jae-Ho Kim,, Joung-Woo Lee,, Kyung-Sik Mun,, Tae Whan Kim,
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Year:
2006
Language:
english
DOI:
10.1109/nmdc.2006.4388777
File:
PDF, 542 KB
english, 2006
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