[IEEE 2006 IEEE Nanotechnology Materials and Devices Conference - Gyeongju, South Korea (2006.10.22-2006.10.25)] 2006 IEEE Nanotechnology Materials and Devices Conference - Multilevel dual-channel NAND flash memories with high-speed read and verifying program
Jae-Ho Kim,, Joung-Woo Lee,, Kyung-Sik Mun,, Tae Whan Kim,Year:
2006
Language:
english
DOI:
10.1109/nmdc.2006.4388777
File:
PDF, 542 KB
english, 2006