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[IEEE 2015 IEEE 42nd Photovoltaic Specialists Conference (PVSC) - New Orleans, LA, USA (2015.6.14-2015.6.19)] 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) - Native oxide and optical constant determination of InP lattice-matched quaternary materials using variable angle spectroscopic ellipsometry
Kotulak, Nicole A., Lumb, Matthew P., Yakes, Michael K., Schmieder, Kenneth J., Gonzalez, Maria, Ebert, Chris, Walters, Robert J.Year:
2015
Language:
english
DOI:
10.1109/pvsc.2015.7356080
File:
PDF, 914 KB
english, 2015