A non-destructive, non-contact, quality test of critical current for Ag-BiSCCO tape
Gandini, A., Weinstein, R., Parks, D., Sawh, R.-P., Shi Xue Dou,Volume:
13
Language:
english
Journal:
IEEE Transactions on Appiled Superconductivity
DOI:
10.1109/tasc.2003.812305
Date:
June, 2003
File:
PDF, 249 KB
english, 2003