[IEEE International Test Conference - Baltimore, MD, USA...

  • Main
  • [IEEE International Test Conference -...

[IEEE International Test Conference - Baltimore, MD, USA (30 Oct.-1 Nov. 2001)] Proceedings International Test Conference 2001 (Cat. No.01CH37260) - Enhanced reduced pin-count test for full-scan design

Vranken, G., Waayers, T., Fleury, H., Lelouvier, D.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2001
Language:
english
DOI:
10.1109/test.2001.966695
File:
PDF, 1.45 MB
english, 2001
Conversion to is in progress
Conversion to is failed