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[IEEE International Test Conference - Baltimore, MD, USA (30 Oct.-1 Nov. 2001)] Proceedings International Test Conference 2001 (Cat. No.01CH37260) - Enhanced reduced pin-count test for full-scan design
Vranken, G., Waayers, T., Fleury, H., Lelouvier, D.Year:
2001
Language:
english
DOI:
10.1109/test.2001.966695
File:
PDF, 1.45 MB
english, 2001