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[IEEE International Test Conference, 2003. ITC 2003. - Washington, DC, USA (Sept. 30-Oct. 2, 2003)] International Test Conference, 2003. Proceedings. ITC 2003. - Exploiting programmable bist for the diagnosis of embedded memory cores
Appello, D., Bernardi, P., Fudoli, A., Rebaudengo, M., Reorda, M.S., Tancorre, V., Violante, M.Volume:
1
Year:
2003
Language:
english
DOI:
10.1109/test.2003.1270861
File:
PDF, 726 KB
english, 2003