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[IEEE International Test Conference, 2003. ITC 2003. - Washington, DC, USA (Sept. 30-Oct. 2, 2003)] International Test Conference, 2003. Proceedings. ITC 2003. - A scalable scan-path test point insertion technique to enhance delay fault coverage for standard scan designs
Seongmoon Wang,, Chakradhar, S.T.Volume:
1
Year:
2003
Language:
english
DOI:
10.1109/test.2003.1270884
File:
PDF, 1.15 MB
english, 2003