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[IEEE 2009 IEEE International Test Conference (ITC) - Austin, TX, USA (2009.11.1-2009.11.6)] 2009 International Test Conference - Test chip experiments at stanford CRC
Al-Yamani, Ahmed, Chang, Jonathan, Franco, Piero, Li, James, Ma, Siyad, Mitra, Subhasish, Park, Intaik, Tseng, Chao-wen, Volkerink, ErikYear:
2009
Language:
english
DOI:
10.1109/test.2009.5355839
File:
PDF, 244 KB
english, 2009