Effects of Thermal Drifts on the Calibration of Capacitive Displacement Probes at the Nanometer Level of Accuracy
Bouderbala, Kamelia, Nouira, Hichem, Girault, Manuel, Videcoq, Etienne, Salgado, Jose AntonioVolume:
64
Language:
english
Journal:
IEEE Transactions on Instrumentation and Measurement
DOI:
10.1109/tim.2015.2440563
Date:
November, 2015
File:
PDF, 7.23 MB
english, 2015