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[IEEE 2015 IEEE Conference on Visual Analytics Science and Technology (VAST) - Chicago, IL, USA (2015.10.25-2015.10.30)] 2015 IEEE Conference on Visual Analytics Science and Technology (VAST) - Exploring trajectory data using ComVis CMV tool VAST 2015 Mini-Challenge 1
Matkovic, Kresimir, Gracanin, Denis, Splechtna, Rainer, Diehl, Alexandra, Elshehaly, Mai, Delrieux, ClaudioYear:
2015
Language:
english
DOI:
10.1109/vast.2015.7347663
File:
PDF, 1.05 MB
english, 2015