Study of the structure of silica film by infrared...

Monthly Notices of the Royal Astronomical Society 1998 Vol. 299; Iss. 1

Study of the structure of silica film by infrared spectroscopy and electron diffraction analyses

Tomonari Morioka, Seiji Kimura, Noritoshi Tsuda, Chihiro Kaito, Yoshio Saito, Chiyoe Koike
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Volume:
299
Year:
1998
Language:
english
Pages:
5
DOI:
10.1046/j.1365-8711.1998.01743.x
File:
PDF, 533 KB
english, 1998
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