[IEEE 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Amsterdam, Netherlands (2014.10.1-2014.10.3)] 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Diagnosis of segment delay defects with current sensing
Aljubouri, Wisam, Somashekar, Ahish Mysore, Haniotakis, Themistoklis, Tragoudas, SpyrosYear:
2014
Language:
english
DOI:
10.1109/dft.2014.6962101
File:
PDF, 204 KB
english, 2014