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[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - Test structures for electromigration evaluation in submicron technology
Morgan, S., De Munari, I., Scorzoni, A., Fantini, F., Magri, G., Zaccherini, C., Caprile, C.Year:
1996
Language:
english
DOI:
10.1109/icmts.1996.535661
File:
PDF, 691 KB
english, 1996