[IEEE 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Vail, Colorado, USA (20-22 May 2003)] Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - 3a technology based fault diagnosis and fault mining
Lei Jia,, Renqing Pei,, Bin Li,, Guangxiao Yao,Volume:
1
Year:
2003
Language:
english
DOI:
10.1109/imtc.2003.1208149
File:
PDF, 244 KB
english, 2003