[IEEE 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Vail, Colorado, USA (20-22 May 2003)] Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Towards an information-based approach for the dependability evaluation of distributed control systems
Jumel, F., Thiriet, J.M., Aubry, J.F., Malasse, O.Volume:
1
Year:
2003
Language:
english
DOI:
10.1109/imtc.2003.1208165
File:
PDF, 378 KB
english, 2003