[IEEE 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Chicago, Il, USA (8-12 Aug. 2005)] 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - ESD susceptibility characterization of an EUT by using 3D ESD scanning system
Kai Wang,, Jayong Koo,, Muchaidze, G., Pommerenke, D.J.Volume:
2
Year:
2005
Language:
english
DOI:
10.1109/isemc.2005.1513538
File:
PDF, 1.11 MB
english, 2005