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[IEEE 2015 IEEE International Symposium on Electromagnetic Compatibility - EMC 2015 - Dresden, Germany (2015.8.16-2015.8.22)] 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC) - Validation of a flexible causality treatment for transient analysis of nonlinearly loaded structures
Yang, Cheng, Bruns, Heinz-D., Liu, Peiguo, Schuster, ChristianYear:
2015
Language:
english
DOI:
10.1109/isemc.2015.7256210
File:
PDF, 1.96 MB
english, 2015