[IEEE 2003 International Conference Physics and Control. - Saint Petersburg, Russia (20-22 Aug. 2003)] 2003 IEEE International Workshop on Workload Characterization (IEEE Cat. No.03EX775) - Thin films induced by nanometric powders flotation
Sandu, I., Morjan, I., Voicu, I., Alexandrescu, R., Dumitrache, F., Soare, I., Ploscaru, I., Fleaca, M., Popovici, E., Vasile, E.Volume:
3
Year:
2003
Language:
english
DOI:
10.1109/phycon.2003.1237025
File:
PDF, 271 KB
english, 2003