BTIarray: A Time-Overlapping Transistor Array for Efficient...

IEEE Transactions on Device and Materials Reliability 2014 / 9 Vol. 14; Iss. 3

BTIarray: A Time-Overlapping Transistor Array for Efficient Statistical Characterization of Bias Temperature Instability

Awano, Hiromitsu, Hiromoto, Masayuki, Sato, Takashi
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Volume:
14
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2014.2327164
Date:
September, 2014
File:
PDF, 1.85 MB
english, 2014
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