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Encapsulating Ion-Solid Interactions in Metal-Oxide-Semiconductor (MOS) Devices
Shyam, Radhey, Kulkarni, Dhruva D., Field, Daniel A., Srinadhu, Endu S., Harriss, James E., Harrell, William R., Sosolik, Chad E.Volume:
62
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2015.2489468
Date:
December, 2015
File:
PDF, 752 KB
english, 2015