[IEEE 2006 16th Biennial University/Government/Industry...

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[IEEE 2006 16th Biennial University/Government/Industry Microelectronics Symposium - San Jose, CA (2006.6.25-2006.6.28)] 2006 16th Biennial University/Government/Industry Microelectronics Symposium - Numerical and Analytical Results for the Polysilicon Gate Depletion Effect on MOS Gate Capacitance

Abebe, H., Cumberbatch, E., Morris, H., Tyree, V.
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Year:
2006
Language:
english
DOI:
10.1109/ugim.2006.4286364
File:
PDF, 1.71 MB
english, 2006
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