SPIE Proceedings [SPIE SPIE LASE - San Francisco, California, United States (Saturday 13 February 2016)] High-Power Laser Materials Processing: Lasers, Beam Delivery, Diagnostics, and Applications V - Inline monitoring of laser processing: new industrial results with the low coherence interferometry sensor approach
Dorsch, Friedhelm, Kaierle, Stefan, Kogel-Hollacher, Markus, Schoenleber, Martin, Bautze, Thibault, Moser, Rüdiger, Strebel, MatthiasVolume:
9741
Year:
2016
Language:
english
DOI:
10.1117/12.2208004
File:
PDF, 406 KB
english, 2016