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Analysis of characteristics for periodically doped channel field-effect transistors under extreme thermal conditions
Krasnyuk, A. A., Orlov, O. M., Imametdinov, E. F., Mar’ina, E. V.Volume:
44
Language:
english
Journal:
Russian Microelectronics
DOI:
10.1134/S1063739715040083
Date:
July, 2015
File:
PDF, 546 KB
english, 2015